发明名称 |
METHOD FOR MANUFACTURING THIN FILM TRANSISTOR |
摘要 |
PURPOSE: A method for manufacturing a thin film transistor is provided to realize a gate electrode sidewall having a positive profile by forming a spacer of a polysilicon layer on a side wall of a thin film transistor gate electrode. CONSTITUTION: A method for manufacturing a thin film transistor comprises the following steps. A conductive layer is formed on an upper portion of an insulating layer(20). The conductive layer is etched excessively and a gate electrode(21) is formed therefrom. A conductive spacer(22a) is formed at both sides of the gate electrode. A gate insulating layer(23) is formed on upper portions of the gate electrode and the insulating layer(20). A channel layer(24a) is formed on the gate insulating layer.
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申请公布号 |
KR20010004614(A) |
申请公布日期 |
2001.01.15 |
申请号 |
KR19990025308 |
申请日期 |
1999.06.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
LEE, SEONG GWON;MA, SUK RAK |
分类号 |
H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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