发明名称 MEASURING METHOD FOR WALL THICKNESS OF CYLINDRICAL OBJECT
摘要 PROBLEM TO BE SOLVED: To measure a wall thickness of a cylindrical object by acquiring an attenuation profile from the digital image of radiant image of a cylindrical part, and deciding the position of outside surface and inside surface of the wall from a density profile while the wall thickness is decided as an interval between the outside-surface and inside-surface positions of the wall. SOLUTION: A cylindrical object 1 is irradiated with an X-ray or γ-ray 2 of an appropriate energy. An intensity profile P is acquired as a function of measurement position from a radiant picture image projected on a detector of flat, linear, or dot/scan type. This is acquired from an electronic or photon counter value through analogue/digital conversion, digitizing of optical scanner means, or scanning of picture film and fluorescent screen for optical stimulation. The intensity profile P is acquired from the change in wall thickness PW as a function of a lateral irradiation position Y. The corresponding points are shown as S1-S4 in the intensity profile P, and the wall thickness on left side or right side is decided from a distance S2-S1 or S4-S3 along the Y-axis.
申请公布号 JP2001004352(A) 申请公布日期 2001.01.12
申请号 JP20000135830 申请日期 2000.05.09
申请人 AGFA GEVAERT NV 发明人 WILLEMS PETER;BARUTO BETSUSEN;DEWAELE PIET;JENNER ONERU;UWE EBERT
分类号 F16L1/00;G01B15/02;G01N23/04;G06T7/60 主分类号 F16L1/00
代理机构 代理人
主权项
地址