| 摘要 |
PROBLEM TO BE SOLVED: To measure jitter of a CRT at high speed and with high accuracy. SOLUTION: A data fetch control section 2 of this jitter quantity measurement instrument displays a test pattern, consisting of the arrangement of a plurality of dots generated by a signal generator 4 on a color CRT 6 for a plurality of number of times so that positions of an emitting phosphor in each dot differ between dots by changing the raster size, and a CCD camera 3 picks up an image of the test pattern for each display. A control section 51 calculates the luminance gravity center of a profile of dots at each display position on the basis of an image signal of the picked-up image, calculates the displacement of the luminance gravity center as a jitter quantity and a display device 52 displays the calculation result. Using the picked-up image consisting of a plurality of dots, where the luminescent position of each phosphor in each dot differs from each other for calculating the luminance gravity center of the profile, the jitter quantity can be measured at a high speed and with high accuracy.
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