发明名称 ION COMPONENT ANALYZING METHOD USING CONCENTRATION METHOD AND DEVICE THEREFOR
摘要 PROBLEM TO BE SOLVED: To prevent contamination in a sample and to easily carry out concentration analysis of ion components in the sample by passing an eluting solvent through a separation column for feeding out ions after concentration of the ion components in the column and separating and detecting the ion constituents in the sample. SOLUTION: A suction device is used for a means for passing a liquid through a concentration column 1. For example, a vacuum pump 2 is used. A six-way valve 4 is used for passing a sample or for passing an eluting solvent through the concentration column 1. An analyzing column 5 and the eluting solvent is selected variably according to an objective ion. A detection unit 7 detects an ion separated in the analyzing column 5. A suppressor method consists of a suppressor and a conductivity detector, while a non-suppressor method consists of a conductivity detector alone. A data processor 8 plots a time and a signal intensity so as to draw a chromatogram according to signals fed from the detector, and a quantity of each ion is measured from an area of a peak corresponding to each ion.
申请公布号 JP2001004610(A) 申请公布日期 2001.01.12
申请号 JP19990176158 申请日期 1999.06.23
申请人 SHOWA DENKO KK 发明人 TOKUDA TOSHIO;KOMURO MASUHIRO
分类号 G01N30/08;B01J20/281;B01J20/283;B01J20/284;B01J20/285;G01N30/88;(IPC1-7):G01N30/08;G01N30/48 主分类号 G01N30/08
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