发明名称 CMOS compatible SOI process
摘要 The process involves using a Silicon-On-Insulator or SOI wafer substrate with an upper substrate layer (26) for forming the CMOS components (34-40), a lateral insulation layer (24) beneath it and bearer layer (22) beneath that. The thickness of the upper layer is less than or equal to the maximum trench depth and the upper layer contains vertical insulation layers (28) down to the lateral insulation layer with components formed in the intermediate regions : An independent claim is also included for an IC with CMOS components.
申请公布号 EP1067600(A1) 申请公布日期 2001.01.10
申请号 EP20000114377 申请日期 2000.07.05
申请人 ELMOS SEMICONDUCTOR AG 发明人 BORNEFELD, RALF, DIPL.-ING.
分类号 H01L21/762;H01L21/84;H01L27/12 主分类号 H01L21/762
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