发明名称 |
Method for fabricating a capacitor |
摘要 |
A method for fabricating a capacitor. A first metal layer is formed on a provided substrate. A dielectric film is formed on the first metal layer. The dielectric film can be a mono-layer structure or a multi-layer structure comprising various dielectric materials. A rapid thermal process (RTP), such as a rapid thermal annealing, or a plasma treatment is performed to enhance the quality of the dielectric film. A photolithography and etching process is performed to remove a part of the dielectric film and the first metal layer to expose a part of the inter-layer dielectric layer. The remaining first conductive layer is used as a lower electrode. A conventional interconnect process is performed on the exposed inter-layer dielectric layer and on the dielectric film. For example, a glue layer is formed on the exposed inter-layer dielectric layer and on the dielectric film. A second metal layer is formed on the glue layer. A photolithography and etching process is performed to remove a part of the second conductive layer. The second metal layer remaining on the inter-layer dielectric layer is used as a wiring line for interconnection. The glue layer remaining on the dielectric film is used as an upper electrode.
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申请公布号 |
US6171899(B1) |
申请公布日期 |
2001.01.09 |
申请号 |
US19990267535 |
申请日期 |
1999.03.12 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
LIOU FU-TAI;LUR WATER;SU KUAN-CHENG;WU JUAN-YUAN |
分类号 |
H01L21/02;H01L21/768;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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