发明名称 Method for fabricating a capacitor
摘要 A method for fabricating a capacitor. A first metal layer is formed on a provided substrate. A dielectric film is formed on the first metal layer. The dielectric film can be a mono-layer structure or a multi-layer structure comprising various dielectric materials. A rapid thermal process (RTP), such as a rapid thermal annealing, or a plasma treatment is performed to enhance the quality of the dielectric film. A photolithography and etching process is performed to remove a part of the dielectric film and the first metal layer to expose a part of the inter-layer dielectric layer. The remaining first conductive layer is used as a lower electrode. A conventional interconnect process is performed on the exposed inter-layer dielectric layer and on the dielectric film. For example, a glue layer is formed on the exposed inter-layer dielectric layer and on the dielectric film. A second metal layer is formed on the glue layer. A photolithography and etching process is performed to remove a part of the second conductive layer. The second metal layer remaining on the inter-layer dielectric layer is used as a wiring line for interconnection. The glue layer remaining on the dielectric film is used as an upper electrode.
申请公布号 US6171899(B1) 申请公布日期 2001.01.09
申请号 US19990267535 申请日期 1999.03.12
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIOU FU-TAI;LUR WATER;SU KUAN-CHENG;WU JUAN-YUAN
分类号 H01L21/02;H01L21/768;(IPC1-7):H01L21/824 主分类号 H01L21/02
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