发明名称 Structure of stacked barrier layer
摘要 A structure of a stacked barrier layer is provided. A first titanium layer is formed on a semiconductor substrate using plasma enhanced chemical vapor deposition (PECVD). At least a stacked barrier layer is formed on the first titanium layer. The stacked barrier layer includes a first titanium nitride layer and a plasma treated titanium nitride layer. The plasma treated titanium nitride layer is treated using a plasma gas including ammonia gas and nitrogen gas.
申请公布号 US6171717(B1) 申请公布日期 2001.01.09
申请号 US19980181303 申请日期 1998.10.28
申请人 UNITED MICROELECTRONICS CORP. 发明人 CHANG TING-CHANG;HU JUNG-CHIH
分类号 H01L21/768;(IPC1-7):B32B18/00 主分类号 H01L21/768
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