发明名称 Furnace for rapid thermal processing
摘要 A Method (1) for Rapid Thermal Processing of a wafer (7), wherein the wafer (7) is heated by lamps (9), and the heat radiation is reflected by an optical switching device (15,17) which is in the reflecting state during the heating stage. During the cooling stage of the wafer (7), the heat is absorbed by the switching device (15,17), which is in the heat-absorbing state. The switching device includes a switching film of a trivalent metal, such as gadolinium, which is capable of forming hydrides by an exchange of hydrogen. Dependent on the hydrogen concentration of the hydrides, the film reflects or absorbs heat. The hydrogen content in the switching film can be changed by varying the partial pressure of hydrogen, or, preferably, by varying the potential of the switching film forming part of a stack of layers in an electrochemical cell.
申请公布号 US6173116(B1) 申请公布日期 2001.01.09
申请号 US20000506543 申请日期 2000.02.17
申请人 U.S. PHILIPS CORPORATION 发明人 ROOZEBOOM FREDDY;DUINE PETER A.;VAN DER SLUIS PAUL
分类号 C30B25/10;C30B31/12;H01L21/00;(IPC1-7):A21B2/00 主分类号 C30B25/10
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