Immunity evaluation method and apparatus for electronic circuit device and LSI tester

摘要

An apparatus and a method for checking that an electronic circuit device or an electronic circuit component such as an LSI operates normally or abnormally by applying an input pattern to the electronic circuit device or the electronic circuit component together with electromagnetic noises before comparing an obtained output pattern with an expected pattern so as to judge whether or not the patterns match in order to evaluate immunity to electromagnetic noises (conductive or radiation noises).