发明名称 HIGH-DENSITY SPUTTERING SINTERED TARGET MATERIAL NOT CRACKED EVEN IN HIGH-SPEED FILM FORMING CONDITION
摘要 PROBLEM TO BE SOLVED: To provide a high-density sputtering sintered target material for forming an electrode thin film for a high dielectric oxide capacitor which is not cracked even in a high-speed film forming condition. SOLUTION: This material is formed from a multiple oxide sintered material expressed by the composition formula of (La, Sr)CoO3 and with its main structural phrase having a perovskite structure. The contents of the carbon (C), sodium (Na) and potassium (K) as inevitable impurities are controlled to <=100 ppm, <=10 ppm and <=5 ppm, respectively and the porosity is kept at <=15%.
申请公布号 JP2001002471(A) 申请公布日期 2001.01.09
申请号 JP19990173780 申请日期 1999.06.21
申请人 MITSUBISHI MATERIALS CORP 发明人 WATANABE KAZUO;MISHIMA TERUSHI;MARUYAMA HITOSHI
分类号 C04B35/00;C01G51/00;C04B35/495;C23C14/34 主分类号 C04B35/00
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