发明名称 |
HIGH-DENSITY SPUTTERING SINTERED TARGET MATERIAL NOT CRACKED EVEN IN HIGH-SPEED FILM FORMING CONDITION |
摘要 |
PROBLEM TO BE SOLVED: To provide a high-density sputtering sintered target material for forming an electrode thin film for a high dielectric oxide capacitor which is not cracked even in a high-speed film forming condition. SOLUTION: This material is formed from a multiple oxide sintered material expressed by the composition formula of (La, Sr)CoO3 and with its main structural phrase having a perovskite structure. The contents of the carbon (C), sodium (Na) and potassium (K) as inevitable impurities are controlled to <=100 ppm, <=10 ppm and <=5 ppm, respectively and the porosity is kept at <=15%. |
申请公布号 |
JP2001002471(A) |
申请公布日期 |
2001.01.09 |
申请号 |
JP19990173780 |
申请日期 |
1999.06.21 |
申请人 |
MITSUBISHI MATERIALS CORP |
发明人 |
WATANABE KAZUO;MISHIMA TERUSHI;MARUYAMA HITOSHI |
分类号 |
C04B35/00;C01G51/00;C04B35/495;C23C14/34 |
主分类号 |
C04B35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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