Methods of testing integrated circuits to include data traversal path identification information and related status information in test data streams,申请号US09/060478-传众专利搜索

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发明名称	Methods of testing integrated circuits to include data traversal path identification information and related status information in test data streams
摘要
申请公布号	US6173425(B2)	申请公布日期	2001.01.09
申请号	US09/060478	申请日期	1998.04.15
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
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