发明名称 PROCEDE POUR LA FABRICATION ET LE TEST DE MICROMODULES ELECTRONIQUES, NOTAMMENT POUR CARTES A PUCE
摘要 The invention concerns a method for electrically separating metal contacts (3) from module support films (1) for chip cards, whereby said metal contacts are electrically separated by cutting the metal without perforating the dielectric bearing them. The metal may be cut for example by continuous or alternate sawing, or by a technique selected among cutting processes with laser, electrical discharge machining, shearing, mechanical pinch or electrical backfire, or by any combination of those techniques. The invention is useful for testing assemblies for chip cards.
申请公布号 FR2795907(A1) 申请公布日期 2001.01.05
申请号 FR19990008754 申请日期 1999.07.01
申请人 GEMPLUS 发明人 LAVIRON THIERRY;ELBAZ DIDIER;CALVAS BERNARD;FIDALGO JEAN CHRISTOPHE
分类号 G06K19/077;H05K1/00;H05K3/02;H05K3/04;H05K3/20;H05K3/22;H05K3/40;(IPC1-7):H05K3/22;H05K13/08 主分类号 G06K19/077
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