发明名称 |
MEMORY MODULE USING A MEMORY DEVICE HAVING A DEFECT |
摘要 |
PURPOSE: A memory module using a memory device having a defect is provided to reduce a manufacturing cost without affecting an operation or performance of the memory module, by reusing a product having the defect in data lines of the memory device for an error correction code(ECC). CONSTITUTION: A memory module using a memory device having a defect comprises a printed circuit board(PCB), four dynamic random access memory(DRAM) devices and a DRAM device for an error correction code(ECC). The PCB includes a pattern for forming a memory module and a pattern for processing eighty data lines. The four DRAM devices are mounted on the PCB, and form the memory module for inputting/outputting 64 real data. The DRAM device for the ECC is mounted on the PCB, using only 8 data lines out of 16 data lines. The DRAM device for the ECC uses the DRAM device having the defect in upper or lower 8 data lines out of the 16 data lines.
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申请公布号 |
KR20010001342(A) |
申请公布日期 |
2001.01.05 |
申请号 |
KR19990020489 |
申请日期 |
1999.06.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, HWA JIN;SEO, SEUNG JIN |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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