发明名称 METHOD FOR MANUFACTURING A CONTACT HOLE OF A SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a contact hole of a semiconductor device is to provide a superior filling characteristic of a contact hole and to simplify a manufacturing process, by forming the contact hole only by a dry etching process using an HI mixture gas. CONSTITUTION: After a transistor consisting of a gate(4), a drain(3) and a source(2) is formed in a semiconductor substrate(1), the first interlayer dielectric(6) is formed. The first metal interconnection(8) is formed on the entire surface of the substrate, and the second interlayer dielectric(9) is formed. After a photoresist layer pattern is formed on the entire surface, a contact hole(14,15) is formed by a dry etching process using an HI mixture gas to expose the first metal interconnection. The photoresist layer pattern is eliminated, and the second metal interconnection filling the contact hole is formed.
申请公布号 KR20010001964(A) 申请公布日期 2001.01.05
申请号 KR19990021514 申请日期 1999.06.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, CHANG JU;PARK, CHAN RO
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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