发明名称 TOPOGRAPHER FOR REAL TIME ABLATION FEEDBACK
摘要 A surface contouring system may be provided with a topographer to measure the surface contours. The topographer may be a laser topographer that measures the surface contours using superheterodyne synthetic wavelength interferometry. The maximum vertical step size dictated by the limits of conventional laser interferometry may be increased by creating laser signals with synthetically-generated longer effective wavelengths. The topographer may perform sequential scans rapidly so that measurement feedback can be used to interactively control the shape of the surface being measured. The interferometer may use counter-rotating optical wedges to create a rotating, radially looping scan pattern that concentrates measurement density in the center portions of the target surface. Different embodiments of the topographer may be applied to diverse uses such as corneal ablation, procedures, precision machining operations, and vibration analysis.
申请公布号 WO0101064(A2) 申请公布日期 2001.01.04
申请号 WO2000US17264 申请日期 2000.06.23
申请人 MACPHERSON, DAVID;DISHLER, JON, G. 发明人 MACPHERSON, DAVID;DISHLER, JON, G.
分类号 A61B3/107;G01B9/02;G01B11/24;G01B11/255;(IPC1-7):G01B/ 主分类号 A61B3/107
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