发明名称 Method for making a diffused back-side layer on a bonded-wafer with a thick bond oxide
摘要 <p>Integrated circuits, semiconductor devices and methods for making the same are described. Each embodiment shows a diffused, doped backside layer in a device wafer that is oxide bonded to a handle wafer. The diffused layer may originate in the device wafer, in the handle wafer, in the bond oxide or in an additional semiconductor layer of polysilicon or epitaxial silicon. The methods use a thermal bond oxide or a combination of a thermal and a deposited oxide. <IMAGE></p>
申请公布号 EP1065706(A2) 申请公布日期 2001.01.03
申请号 EP20000111199 申请日期 2000.05.24
申请人 INTERSIL CORPORATION 发明人 CZAGAS, JOSEPH;WOODBURY, DUSTIN;BEASOM, JAMES
分类号 H01L21/22;H01L21/02;H01L21/18;H01L21/20;H01L21/225;H01L21/265;H01L21/336;H01L21/74;H01L21/762;H01L27/12;H01L29/06;H01L29/10;H01L29/78;(IPC1-7):H01L21/225 主分类号 H01L21/22
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