发明名称 Semiconductor device
摘要 The epitaxial substrate of a semiconductor chip device has a resurf diffusion in at least one of its isolated wells in the device chip surface. The wells are separated by junction diffusions. The thickness of the epitaxial layer is reduced by placing an increased percentage of its total charge for given a breakdown voltage (punch-through voltage) in the lower portion of the layer.
申请公布号 GB2309589(B) 申请公布日期 2001.01.03
申请号 GB19970001069 申请日期 1997.01.20
申请人 * INTERNATIONAL RECTIFIER CORPORATION 发明人 NIRAJ * RANJAN
分类号 H01L23/58;H01L29/06;H01L29/08;H01L29/10;H01L29/40;H01L29/739;H01L29/78;H01L29/861;(IPC1-7):H01L21/20 主分类号 H01L23/58
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