Circuit and method for fully on-chip wafer level burn-in test,申请号US09/317210-传众专利搜索

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发明名称	Circuit and method for fully on-chip wafer level burn-in test
摘要
申请公布号	US6169694(A)	申请公布日期	2001.01.02
申请号	US09/317210	申请日期	1999.05.24
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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