发明名称 Measuring apparatus and method for measuring characteristic of solar cell
摘要 A predetermined area of a photo-sensing surface of a solar cell is illuminated, and a voltage vs. current characteristic is measured. Note, the rest of the photo-sensing surface which is not illuminated is called a dark area. Next, in a dark state in which the photo-sensing surface is not illuminated, a dark characteristic of the solar cell is measured. The obtained dark characteristic is multiplied by a ratio of the area of the dark area to the area of the photo-sensing surface, thereby a dark characteristic of the dark area is calculated. Then, a difference characteristic between the measured voltage vs. current characteristic and the dark characteristic of the dark area is calculated. The difference characteristic is multiplied by a ratio of the area of the photo-sensing surface to the area of the illuminated portion, thereby a voltage vs. current characteristic of the solar cell in a state corresponding to that the entire area of the photo-sensing surface is illuminated at once is obtained.
申请公布号 US6169414(B1) 申请公布日期 2001.01.02
申请号 US19980106469 申请日期 1998.06.30
申请人 CANON KABUSHIKI KAISHA 发明人 YOSHINO TAKEHITO;OHTSUKA TAKASHI
分类号 H01L31/04;G01R31/26;(IPC1-7):G01R31/26 主分类号 H01L31/04
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