发明名称 Logic circuit verification apparatus and method for semiconductor integrated circuit
摘要 There is constituted a logic circuit verification apparatus designed for checking a semiconductor integrated circuit including a core and a new circuit. The core has a internal circuit in which logic and timing have already been verified. The apparatus is provided with a section for extracting from the cells of the core timing cells which are required to be subjected to timing verification when the core is used in combination with the new circuit. The apparatus is also provided with a section for extracting from the cells of the core delay cells which are required to be subjected to time delay calculation when the core is used in combination with the new circuit. At the time of simulation, predetermined processing is performed solely with regard to the extracted cells.
申请公布号 US6170072(B1) 申请公布日期 2001.01.02
申请号 US19980201092 申请日期 1998.11.30
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MORIGUCHI YASUO;INOSHITA TOSHINORI;INOUE YOSHIO
分类号 G01R31/302;G01R31/30;G06F17/50;H01L21/82;(IPC1-7):G01R31/28 主分类号 G01R31/302
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