发明名称 Site-selective electrochemical deposition of copper
摘要 A method is provided for selectively electrochemically depositing copper. The method includes forming a layer of dielectric material above a structure layer, forming a conductive layer above the layer of dielectric material and forming an opening in the conductive layer and the layer of dielectric material. The method also includes selectively forming at least one barrier metal layer and a copper seed layer only in the opening, the at least one barrier metal layer and the copper seed layer being conductively coupled to the conductive layer. The method further includes forming an insulating layer above the conductive layer, and selectively electrochemically depositing copper only in the opening.
申请公布号 US6168704(B1) 申请公布日期 2001.01.02
申请号 US19990244469 申请日期 1999.02.04
申请人 ADVANCED MICRO DEVICE, INC. 发明人 BROWN THOMAS M.;HYMES STEPHEN W.
分类号 C25D5/02;C25D5/10;H01L21/768;(IPC1-7):C25D5/02 主分类号 C25D5/02
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