发明名称 Method for producing barrier-free semiconductor memory configurations
摘要 A method for producing an integrated semiconductor memory configuration, in particular uses ferroelectric materials as storage dielectrics. A conductive connection between a first electrode of a storage capacitor and a selection transistor is produced only after deposition of the storage dielectric.
申请公布号 US6168988(B1) 申请公布日期 2001.01.02
申请号 US19990281691 申请日期 1999.03.30
申请人 INFINEON TECHNOLOGIES, AG 发明人 SCHINDLER GUENTHER;HARTNER WALTER;HINTERMAIER FRANK;MAZURE-ESPEJO CARLOS
分类号 H01L21/768;H01L21/02;H01L21/822;H01L21/8242;H01L21/8247;H01L27/04;H01L27/10;H01L27/108;H01L27/115;(IPC1-7):H01L21/824;H01L21/00;H01L21/76 主分类号 H01L21/768
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