| 摘要 |
<p>The integrated circuit according to the invention includes pairs (12) of equal assemblies (1, 2) of magnetic sensors (S1, S2) and testing coils (C1, C2) located closely one next to the other. The magnetic sensors (S1, S2) of each part (12) of assemblies (1, 2) are one against the other at an angle pi/2, while in each of the assemblies (1,2) the terminals (t1, t2) of each of the test coils (C1, C2) must take the position defined by taking into account the orientation of the magnetic sensors (S1, S2) and at the angle of pi/2 between them. With the suggested distribution and wiring of the assemblies of the magnetic sensor and the test coil the distortion, arising from the Joule heating of test coils, of the sensor signals is minimised during sensor testing.</p> |
