发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE THEREOF
摘要 A semiconductor device including an insulated-gate field-effect transistor has a gate electrode whose work function is well controlled to be close to the intrinsic mid-gap energy of silicon to reduce impurity concentration in the channel. The insulated-gate field-effect transistor thus prevents the carrier mobility from decreasing and provides higher current-carrying capacity. The gate electrode has a multilayer structure including a p-type polycrystalline or single-crystal germanium film (3) and a low-resistivity conductor film (4).
申请公布号 WO0079601(A1) 申请公布日期 2000.12.28
申请号 WO2000JP03968 申请日期 2000.06.16
申请人 SEIKO EPSON CORPORATION;TAKIZAWA, TERUO;SHIMADA, HIROYUKI 发明人 TAKIZAWA, TERUO;SHIMADA, HIROYUKI
分类号 H01L21/28;H01L21/8238;H01L29/49;(IPC1-7):H01L29/78 主分类号 H01L21/28
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