发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE THEREOF |
摘要 |
A semiconductor device including an insulated-gate field-effect transistor has a gate electrode whose work function is well controlled to be close to the intrinsic mid-gap energy of silicon to reduce impurity concentration in the channel. The insulated-gate field-effect transistor thus prevents the carrier mobility from decreasing and provides higher current-carrying capacity. The gate electrode has a multilayer structure including a p-type polycrystalline or single-crystal germanium film (3) and a low-resistivity conductor film (4).
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申请公布号 |
WO0079601(A1) |
申请公布日期 |
2000.12.28 |
申请号 |
WO2000JP03968 |
申请日期 |
2000.06.16 |
申请人 |
SEIKO EPSON CORPORATION;TAKIZAWA, TERUO;SHIMADA, HIROYUKI |
发明人 |
TAKIZAWA, TERUO;SHIMADA, HIROYUKI |
分类号 |
H01L21/28;H01L21/8238;H01L29/49;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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