发明名称 IMPROVED ACTIVE MATRIX ESD PROTECTION AND TESTING SCHEME
摘要 An improved method of manufacturing active matrix displays with ESD protection through final assembly and in process testing and repair capabilities. At least a first set of shorting bars is formed adjacent the row (12.22) and column (18.28) matrix. The shorting bars are respectively coupled to one another in series to allow testing of the matrix elements. A first shorting bar is coupled to the row lines and a second shorting bar is coupled to the column lines. The shorting bars can remain coupled to the matrix through final assembly to provide ESD protection and final assembly and testing capability.
申请公布号 EP1008177(A4) 申请公布日期 2000.12.27
申请号 EP19980903440 申请日期 1998.01.13
申请人 HYUNDAI ELECTRONICS AMERICA, INC. 发明人 HOLMBERG, SCOTT, H.
分类号 G02F1/136;G02F1/13;G02F1/1362;G02F1/1368;G09F9/30;H01L21/786;H01L29/786 主分类号 G02F1/136
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