发明名称 |
Chemical-Mechanical Polishing Pad |
摘要 |
The invention provides a chemical-mechanical polishing pad, which includes a plurality of annular grooves and a plurality of streamline grooves designed according to principles of the hydrodynamics. The streamline grooves of polishing pad are designed according to flow equations derived from source flow and vortex flow, and the streamline grooves of polishing pad uniformly distribute the slurry on the polishing pad. An angle and a depth of the streamline groove, which are calculated by boundary layer effect of the streamline groove function, are used to design an optimum structure for polishing pad.
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申请公布号 |
GB2345255(B) |
申请公布日期 |
2000.12.27 |
申请号 |
GB19980028786 |
申请日期 |
1998.12.29 |
申请人 |
* UNITED MICROELECTRONICS, CORP. |
发明人 |
JUEN-KUEN * LIN;CHIEN-HSIN * LAI;PENG-YIH * PENG;EDWARD * YANG;KUN-LIN * WU;FU-YANG * YU |
分类号 |
B24B37/00;B24B37/04;B24B37/26;B24D13/12;B24D13/14;H01L21/304;(IPC1-7):B24B41/053 |
主分类号 |
B24B37/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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