发明名称 |
HIGH-TEMPERATURE BALANCE |
摘要 |
A high-temperature balance includes a piezoelectric material, such as langasite (gallium phosphate (Ga PO4), a member of the (Al, Ga) N system), that are stable at high temperatures. The frequency response of the balance is monitored to determine the change in mass of material deposited on the balance in a high-temperature environment. Accordingly, the balance can be used to monitor high-temperature deposition rates or to perform thermogravimetric analysis. The high-temperature balance of this invention can further be operated as a nanobalance to measure monolayer changes in film thickness. |
申请公布号 |
WO0077488(A1) |
申请公布日期 |
2000.12.21 |
申请号 |
WO2000US16436 |
申请日期 |
2000.06.14 |
申请人 |
MASSACHUSETTS INSTITUTE OF TECHNOLOGY |
发明人 |
TULLER, HARRY, L.;FRITZE, HOLGER |
分类号 |
C23C14/54;G01B7/06;G01G3/13;G01N5/04;G01N27/00 |
主分类号 |
C23C14/54 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|