发明名称 HIGH-TEMPERATURE BALANCE
摘要 A high-temperature balance includes a piezoelectric material, such as langasite (gallium phosphate (Ga PO4), a member of the (Al, Ga) N system), that are stable at high temperatures. The frequency response of the balance is monitored to determine the change in mass of material deposited on the balance in a high-temperature environment. Accordingly, the balance can be used to monitor high-temperature deposition rates or to perform thermogravimetric analysis. The high-temperature balance of this invention can further be operated as a nanobalance to measure monolayer changes in film thickness.
申请公布号 WO0077488(A1) 申请公布日期 2000.12.21
申请号 WO2000US16436 申请日期 2000.06.14
申请人 MASSACHUSETTS INSTITUTE OF TECHNOLOGY 发明人 TULLER, HARRY, L.;FRITZE, HOLGER
分类号 C23C14/54;G01B7/06;G01G3/13;G01N5/04;G01N27/00 主分类号 C23C14/54
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