发明名称 Ferroelektrischer Transistor und Verfahren zu dessen Herstellung
摘要 Two source/drain regions (12, 22, 32) between which a channel region is arranged are provided for in a semiconductor substrate (11, 21, 31). A gate dielectric comprising a dielectric intermediate layer (13, 23, 33) and a dielectric structure (14, 24, 34) is positioned on the surface of the channel region. The dielectric structure (14, 24, 34) borders on the dielectric intermediate layer (12, 22, 32) on at least one side which is directed towards one of the source/drain regions (12, 22, 32), whereby the thickness of the gate dielectric above the edge of the source/drain region is greater than the thickness of the dielectric intermediate layer.
申请公布号 DE19926767(A1) 申请公布日期 2000.12.21
申请号 DE1999126767 申请日期 1999.06.11
申请人 INFINEON TECHNOLOGIES AG 发明人 HANEDER, THOMAS;SCHINDLER, GUENTHER
分类号 H01L21/8247;H01L21/336;H01L21/8246;H01L27/105;H01L29/78;H01L29/788;H01L29/792;(IPC1-7):H01L29/78 主分类号 H01L21/8247
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