A test socket with contact projections

摘要

A test socket comprising a plurality of contact terminals (20), each of the contact terminals including one or more contact projections (24) for contacting the external connection terminals (50) of an electronic device or semiconductor package. The tip end of each contact projection (24) is formed to have a smooth curved surface and has a number of protuberances (22) and recesses (23) formed on the tip end. The protuberances (22) and recesses (23) are formed from smooth curved surfaces. The proturberances (22) are for braking an oxide layer 56 in order to engage the outermost layer (can be solder plating) 55 to make good electrical contact when connected to the external connection terminals (50). The curved surfaces of the proturberances (22) can have a radius of curvature of 2 to 15 microns and the contact projections 24 can have a radius of curvature of 0.03 to 0.3 mm. The contact terminals may also be manufactured by electric-discharge machining and then plated with electrolytic nickel and then gold.