发明名称 Cleaning method and apparatus
摘要 <p>For cleaning a wafer by a cleaning apparatus, a cleaning liquid is contained in a cleaning bath. Leaving two brushes open, the wafer is inserted to the cleaning bath, placed on oscillation and rotation rollers and retained by the rollers. The brushes are closed and the wafer is held by the brushes. Next, the two brushes are rotated while the wafer is oscillated and rotated by the rollers and so on. Furthermore, ultrasonic vibrations are applied to the cleaning liquid in the cleaning bath by an ultrasonic generator. Scrub cleaning with the two brushes and ultrasonic cleaning by ultrasonic vibrations are thereby performed on the wafer.</p>
申请公布号 SG77207(A1) 申请公布日期 2000.12.19
申请号 SG19980005348 申请日期 1998.12.08
申请人 TDK CORPORATION 发明人 KOBAYASHI KANJI;KUDO JUN;YAMAGUCHI MASAO;YOSHIHARA SHINYA
分类号 H01L21/304;B08B1/04;B08B3/12;H01L21/00;(IPC1-7):B08B1/04 主分类号 H01L21/304
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