发明名称 MAGNETIC RANDOM ACCESS MEMORY AND MANUFACTURE THEREOF
摘要 <p>PROBLEM TO BE SOLVED: To obtain an improved MRAM device, where a magnetic memory element is capable of avoiding thermal degradation and etching troubles while manufacturing a device manufacturing. SOLUTION: An MRAM device is equipped with a memory element and a circuit which controls the memory element. The circuit is equipped with a transistor 12a and a digit wire 29 and integrated on a board. The circuit is formed through a CMOS process, magnetic memory elements 43 and 44 are demarcated by converting a part 42b of a magnetic blanket layer into an insulating material. The magnetic blanket layer includes magnetic layers 40 and 42 and a nonmagnetic layer 41 sandwiched in between the magnetic layers 40 and 42 and is deposited on a conductive layer 34. Memory elements 43 and 44 are demarcated by an insulating or inactive part 42b and are separated from each other.</p>
申请公布号 JP2000353791(A) 申请公布日期 2000.12.19
申请号 JP20000122085 申请日期 2000.04.24
申请人 MOTOROLA INC 发明人 CHEN EUGENE Y;SLAUGHTER JON M
分类号 G11C11/14;G11B5/39;H01L21/8246;H01L27/10;H01L27/105;H01L27/22;H01L43/08;(IPC1-7):H01L27/10 主分类号 G11C11/14
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