| 摘要 |
PROBLEM TO BE SOLVED: To improve reliability by preventing that a plate line segment is made a floating state and to improve sensing margin. SOLUTION: This random access memory device is provided with NMOS transistors 14 connecting one end of plate lines PLS0-PLSm to word lines WL 0-WLm in accordance with switch control signals SELa, SELb, and NMOS transistors 16 connecting the other end of plate lines PLS0-PLSm to reference voltage (ground voltage) in accordance with switch control signals PRCHGa, PRCHGb.
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