发明名称 |
Method for making MIS transistor |
摘要 |
Disclosed is a method for making a MIS transistor that a gate electrode and gate insulating film are formed on a semiconductor substrate with a channel region formed implanting an impurity of one conductivity type thereinto, which has the steps of: implanting hydrogen ions through said gate electrode and gate insulating film into said channel region under said gate electrode; ion-implanting an impurity of a conductivity type reverse to said one conductivity type self-aligned to said gate electrode to form a source/drain region; and conducting thermal treatment in an inert atmosphere or nitrogen atmosphere.
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申请公布号 |
US6162710(A) |
申请公布日期 |
2000.12.19 |
申请号 |
US19980092649 |
申请日期 |
1998.06.09 |
申请人 |
NEC CORPORATION |
发明人 |
ITO, HIROSHI;HORIUCHI, TADAHIKO |
分类号 |
H01L21/265;H01L21/336;H01L29/08;H01L29/78;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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