发明名称 METHOD FOR SEPARATING CIRCUIT FAULT
摘要 PROBLEM TO BE SOLVED: To easily separate a fault by gating the input of a signature resistor in an active state merely for a range with the specific pattern of a built-in self test(BIST). SOLUTION: A signature dimension is controlled by gating the input of a plurality of input signature resistors(MISR) merely in the specific range of a logic built-in self test(LBIST) pattern. More specifically, an MISR shift resistor sequence generator(SSG) control block 10 generates a gate enable signal to one or a plurality of gates 11 for an MISR input in each cycle where data is clocked to the MISR. The MISRSS control block 10 is driven by an LBIST engine 13, and is synchronized by timing being given by an on product clock generator(OPCG) 12 and a phase-locked loop(PLL) 14.
申请公布号 JP2000352576(A) 申请公布日期 2000.12.19
申请号 JP20000131868 申请日期 2000.04.28
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 KOPROWSKI TIMOTHY J;MOTIKA FRANCO;NIGH PHILLIP J
分类号 G01R31/28;G01R31/3183;G01R31/319;G06F11/22;G11C29/12 主分类号 G01R31/28
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