发明名称 POSITIVE TYPE RADIATION SENSITIVE RESIST COMPOSITION AND PRODUCTION OF RESIST PATTERN USING THE COMPOSITION
摘要 PROBLEM TO BE SOLVED: To form a high definition pattern by incorporating an alkali-soluble resin, a compound whose solubility in an aqueous alkali solution is increased by the action of radiation and a compound which forms an alkali-soluble group under a base. SOLUTION: The positive type radiation sensitive resist composition contains an alkali-soluble resin, a compound whose solubility in an aqueous alkali solution is increased by the action of radiation and one or more compounds which are decomposed by the action of a base and form an alkali-soluble group as principal components. The alkali-soluble group is not limited if it increases solubility in the aqueous alkali solution as a developing solution and the group is preferably a carboxyl group or a phenolic hydroxyl group. In the exposed part into which the aqueous alkali solution penetrates rapidly, the decomposition of the compounds and solubilization proceed rapidly and the velocity of dissolution increases.
申请公布号 JP2000352823(A) 申请公布日期 2000.12.19
申请号 JP19990166823 申请日期 1999.06.14
申请人 TORAY IND INC 发明人 NIO HIROYUKI;TAMURA KAZUTAKA
分类号 H01L21/027;G03F1/68;G03F1/80;G03F7/022;G03F7/023;G03F7/039 主分类号 H01L21/027
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