| 摘要 |
An input buffer and an input-output buffer in full compliance with IDDQ testability are provided, which use a signal fed back to a P-type or N-type controllable switch to turn on or turn off the switch so as to obtain a desired resistance by using an equivalent circuit for the buffer. The problem of reduced operating speed due to the use of a high-impedance resistor is then avoided. Hence, the IDDQ testing results will not be affected by using the input buffer or the input-output buffer, no matter the circuit is operated in an output mode or input mode. Furthermore, the input signal, either in the low state or in the high state, has no effect on the IDDQ testing results either.
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