发明名称 ABRASIVE FOR SEMICONDUCTOR, OBTAINED BY ADDING THICKENER
摘要 <p>PROBLEM TO BE SOLVED: To obtain the subject abrasive containing particles having low sedimentation velocities and capable of maintaining the stability of a dispersion state even after long preservation. SOLUTION: This abrasive is obtained by dispersing cerium oxide having 0.1-0.35μm weight averaged particle diameter, preferably in the proportion of 0.1-20 wt.%, in water or an aqueous medium, containing a thickener, preferably one or more kinds selected from a water-soluble cellulose ether, a polyvinyl alcohol, a polyethylene glycol ether and the like, and regulating the viscosity so as to be 1.2-200 cP. The abrasive is usable for polishing of an insulation membrane or the like on a semiconductor substrate in the production step of a semiconductor device.</p>
申请公布号 JP2000351956(A) 申请公布日期 2000.12.19
申请号 JP19990163411 申请日期 1999.06.10
申请人 SEIMI CHEM CO LTD 发明人 YUGAWA MEGUMI;ENDO KAZUAKI
分类号 B24B37/00;C09K3/14;H01L21/304;(IPC1-7):C09K3/14 主分类号 B24B37/00
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