发明名称 MEASURING APPARATUS FOR THERMAL CONDUCTIVITY OF FINE SINGLE WIRE
摘要 PROBLEM TO BE SOLVED: To provide a measuring apparatus, for the thermal conductivity of a fine single wire, by which the thermal conductivity of an extremely fine single wire is measured effectively and which is of a simple constitution. SOLUTION: In this measuring apparatus for the thermal conductivity of a fine single wire, a board 1 is provided, a pair of current and voltage terminals 2, 3 which are arranged on the board 1 are provided, a hot wire 11 which is arranged and installed across the pair of current and voltage terminals 2, 3 is provided, a standard resistance which is connected in series with the hot wire is provided, a heat storage terminal 4 which is arranged so as to face the hot wire is provided, and a sample thin wire 15 one end of which is connected to the central part of the hot wire 11 and the other end of which is connected to the heat storage terminal 4 is provided. A voltage across both ends of the hot wire and the standard resistance is measured when a DC current is applied to the hot wire and the standard resistance. The heating amount and the average temperature of the hot wire are found. On the basis of their results, the heat flux and the temperature of the end part attached to the hot wire of a sample thin wire are calculated. Thereby, the thermal conductivity of the fine single wire is measured.
申请公布号 JP2000352561(A) 申请公布日期 2000.12.19
申请号 JP19990163218 申请日期 1999.06.10
申请人 JAPAN SCIENCE & TECHNOLOGY CORP 发明人 FUJII MOTOO;CHO KO;FUJIWARA MASAYUKI
分类号 G01N25/18;(IPC1-7):G01N25/18 主分类号 G01N25/18
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