发明名称 |
On-chip test circuit for evaluating an on-chip signal using an external test signal |
摘要 |
An on-chip test circuit for evaluating on-chip signals for a semiconductor memory chip includes an on-chip signal associated with a memory circuit on the chip; said on-chip signal having a signal characteristic to be evaluated; an input circuit for receiving an off-chip test signal; and a test circuit that compares said on-chip signal and said test signal.
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申请公布号 |
US6163862(A) |
申请公布日期 |
2000.12.19 |
申请号 |
US19970980524 |
申请日期 |
1997.12.01 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ADAMS, R. DEAN;COOLEY, EDMOND S.;HANSEN, PATRICK R. |
分类号 |
H01L27/11;G01R31/28;G11C29/02;G11C29/12;G11C29/50;H01L21/8244;H01L27/10;(IPC1-7):G11C29/00 |
主分类号 |
H01L27/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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