| 摘要 |
<p>PROBLEM TO BE SOLVED: To accurately measure high speed current waveform with a simple constitution of a current waveform measuring device and differential probe. SOLUTION: An electrooptical crystal 4 and a resistance element 6 laid by electrode film 5 between a pair of contact pins 3, are connected in parallel, contacted to measured electric circuit wiring 2 cut from the contact pins 3 to introduce the current flowing in the wire into a resistance element 6. The electric potential difference generated in the resistance element 6 is impressed in the electrooptical crystal 4 and laser light is introduced, and the polarization state of the return light is detected with electrooptical sampling to measure the current waveform.</p> |
