发明名称 SCANNING CONFOCAL MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning confocal microscope capable of obtaining correct image information in a short time. SOLUTION: In this confocal microscope, a sample 4 is irradiated with laser beam, the light from the sample 4 is received, and a detection signal in accordance with the intensity of the received light is obtained as the image information of the sample 4. A two-dimensional scanning mechanism 12 two- dimensionally scanning the sample 4 with the laser beam and a revolver 15 adjusting the focal position of the laser beam to the sample 4 are controlled by a two-dimensional scanning driving control circuit 13. Then, the two-dimensional scanning by the mechanism 12 is inhibited in a period when the focal position by the revolver 15 is adjusted.
申请公布号 JP2000352670(A) 申请公布日期 2000.12.19
申请号 JP19990162436 申请日期 1999.06.09
申请人 OLYMPUS OPTICAL CO LTD 发明人 WATABE HIDEO
分类号 G01B11/24;G02B21/00;(IPC1-7):G02B21/00 主分类号 G01B11/24
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