| 摘要 |
PROBLEM TO BE SOLVED: To reduce faults to be simulated as much as possible and to quickly execute fault simulation. SOLUTION: In a logical circuit fault simulation device 10 for simulating the normal operation and fault operation of a logical circuit, a fault generation part 42 selectively uses a logical cell model suited to fault generation and a fault simulation execution part 43 selectively uses the logical cell model suited to the description of a logical function. Consequently an effect for improving the generality of fault compression processing can be obtained.
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