发明名称 |
FABRICATING METHOD FOR TRANSISTOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for forming a transistor of a semiconductor device is provided to improve a characteristic of a semiconductor device by changing a layout or omitting a high density dopant ion implantation process. CONSTITUTION: A field oxide layer(43), a gate oxide layer(45), and a gate electrode(47) are formed on a semiconductor substrate(41). An LDD(Lightly Doped Drain) region is formed by implanting low density dopant ions thereon. An insulating layer spacer(51) is formed at a sidewall of the gate electrode(47). A planarization insulating layer(53) is formed on the whole surface. A contact hole(55) for exposing the LDD region(49) is formed by performing an etching process using a contact mask.
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申请公布号 |
KR100275327(B1) |
申请公布日期 |
2000.12.15 |
申请号 |
KR19970026853 |
申请日期 |
1997.06.24 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
JEON, SEONG-DO;JEONG, JAE-GOAN |
分类号 |
H01L29/70;(IPC1-7):H01L29/70 |
主分类号 |
H01L29/70 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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