发明名称 FABRICATING METHOD FOR TRANSISTOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming a transistor of a semiconductor device is provided to improve a characteristic of a semiconductor device by changing a layout or omitting a high density dopant ion implantation process. CONSTITUTION: A field oxide layer(43), a gate oxide layer(45), and a gate electrode(47) are formed on a semiconductor substrate(41). An LDD(Lightly Doped Drain) region is formed by implanting low density dopant ions thereon. An insulating layer spacer(51) is formed at a sidewall of the gate electrode(47). A planarization insulating layer(53) is formed on the whole surface. A contact hole(55) for exposing the LDD region(49) is formed by performing an etching process using a contact mask.
申请公布号 KR100275327(B1) 申请公布日期 2000.12.15
申请号 KR19970026853 申请日期 1997.06.24
申请人 HYUNDAI ELECTRONICS IND. CO., LTD 发明人 JEON, SEONG-DO;JEONG, JAE-GOAN
分类号 H01L29/70;(IPC1-7):H01L29/70 主分类号 H01L29/70
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