发明名称 |
HIGH EFFICIENCY CHARGE PUMP CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A high-efficiency charge pump circuit of a semiconductor memory device is provided to improve the efficiency of charge supply and to reduce of a power consumption by providing boosting voltage to an end load output terminal. CONSTITUTION: A pull-up transistor(25) pre-charges boosted voltage(Vpp) to VDD-Vt at initial power-up. A high-voltage detecting unit(22) generates a high level signal(HVDET) when source voltage(VDD) reaches to predetermined voltage after powering-up, thereby stopping the operation of a double booster circuit in a charge pump(25). A regulator(23) outputs an on-signal with a high-level when a level of voltage lower than the predetermined voltage is inputted, while monitoring the boosted voltage(Vpp). A controller(21) provides an RAS pulse of high-level to the charge pump(25) during a predetermined period, for the charge pump(25) to perform a pumping operation. An oscillator(24) an oscillated pulse signal(OSCH) with a constant period in response to the on-signal of high-level from the regulator(23). The charge pump(25) performs the pumping operation in response to the oscillated pulse signal(OSCH), until the boosted voltage reaches to VDD+2Vt.
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申请公布号 |
KR100273208(B1) |
申请公布日期 |
2000.12.15 |
申请号 |
KR19970012109 |
申请日期 |
1997.04.02 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
KHANG, CHANG MAN;JUN, YOUNG HYUN |
分类号 |
G11C16/06;G05F3/26;G11C5/14;H02M3/07;(IPC1-7):G11C5/14 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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