| 摘要 |
PROBLEM TO BE SOLVED: To make analyzable an electromagnetic field in a short calculation period and at high accuracy. SOLUTION: This electromagnetic field analyzing device sets an input port and an output port in a part of an object to be analyzed, and sets an S- parameter or the like in each port (step S1). Next, after calculating an electric field (step S2), input wave is calculated (step S3). Next, a convolution integral is performed between input wave and reflection coefficient to calculate reflected wave and transmitted wave field (step S4), and then a magnetic field is calculated using the calculation result (step S5). If the number (n) of times of calculations of the electric field and the magnetic field is smaller than a maximum value nmax, processes of steps S1-S5 are repeated. Because detail analysis using the S-parameter is performed in an region such as a high frequency circuit requiring high accurate analysis, and lattice size is enlarged and the analysis is performed using FD-TD method in a region such as an antenna or a case having radiation, calculation period required for the electromagnetic field analysis can be reduced.
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