发明名称 HIGH-FREQUENCY CIRCUIT
摘要 PROBLEM TO BE SOLVED: To shorten the time for partially testing and adjusting circuit elements in a high-frequency circuit and to improve the measurement accuracy. SOLUTION: Directional couplers 201 and 202 are each provided for the input side and output side of a circuit element 101 to be tested among a plurality of circuit elements 101, 102, and 103 connected by transmission lines, a signal generator 151 is connected to the input-side directional coupler 201, and a detecting circuit 152 is connected to the output-side directional coupler 202. By this constitution, it is possible to test and adjust circuit elements incorporated in a high-frequency circuit easily without the need for a complicated structure. Therefore, it is possible to shorten the time for partially testing and adjusting circuit elements in a high-frequency circuit and to improve measurement accuracy.
申请公布号 JP2000346908(A) 申请公布日期 2000.12.15
申请号 JP19990157163 申请日期 1999.06.03
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUJIWARA HIROSUKE;IMAI YOSHIHIKO;OZAKI YUTAKA;IKEMATSU HIROSHI;IIDA AKIO
分类号 G01R27/04;G01R31/28;H01P1/00;H01P5/18;(IPC1-7):G01R31/28 主分类号 G01R27/04
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