EQUIPMENT FOR TESTING SEMICONDUCTOR DEVICE

摘要

PURPOSE: An equipment for testing a semiconductor device is provided to improve efficiency through testing more than one device at the same time. CONSTITUTION: A tube(201) is fixed to a dual inline package supplier(270). The tube faces upward from a support plate(210). Dual inline packages are stored in store grooves(235) of a store stage(230). A guide transferor(248) transfers a pickup(245) to the grooves. A vacuum adsorb module adsorbs the packages. The pickup is transferred to a test unit(250). The packages are settled in test apparatuses(255) to be tested. The pickup arranges the packages in front of a dual inline package guide member(264) according to test results. A cylinder rod pushes the packages to the guide member.