发明名称 |
MANUFACTURING METHOD OF FERROELECTRIC THIN FILM |
摘要 |
PURPOSE: A method for manufacturing a ferroelectric thin film is provided to restrict a fine crack by using a sputtering method or a laser ablation method. CONSTITUTION: A ferroelectric thin film(120) of Pb(Zr1-xTix)O3 is formed by using one method selected from a pure sol-gel method such as a spin coating and a dip coating, MOCVD, LSCVD, and MOD. A buffering layer(110,130) including a component of Pb is inserted in the process for manufacturing the ferroelectric thin film(120). The buffering layer(110,130) has a thickness of 10-100nm. The buffering layer(110,130) is formed with one of Pb(Zr1-xTix))3, PbO, and PbTiO3 including Pb.
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申请公布号 |
KR100275782(B1) |
申请公布日期 |
2000.12.15 |
申请号 |
KR19950011460 |
申请日期 |
1995.05.10 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM, TAE-SONG;KIM, JUN-HAN;LEE, DONG-HUN;LEE, JUN-KUK;JUNG, HYUNG-JIN |
分类号 |
H01L21/20;C23C14/02;C23C14/08;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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