发明名称 MANUFACTURING METHOD OF FERROELECTRIC THIN FILM
摘要 PURPOSE: A method for manufacturing a ferroelectric thin film is provided to restrict a fine crack by using a sputtering method or a laser ablation method. CONSTITUTION: A ferroelectric thin film(120) of Pb(Zr1-xTix)O3 is formed by using one method selected from a pure sol-gel method such as a spin coating and a dip coating, MOCVD, LSCVD, and MOD. A buffering layer(110,130) including a component of Pb is inserted in the process for manufacturing the ferroelectric thin film(120). The buffering layer(110,130) has a thickness of 10-100nm. The buffering layer(110,130) is formed with one of Pb(Zr1-xTix))3, PbO, and PbTiO3 including Pb.
申请公布号 KR100275782(B1) 申请公布日期 2000.12.15
申请号 KR19950011460 申请日期 1995.05.10
申请人 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 KIM, TAE-SONG;KIM, JUN-HAN;LEE, DONG-HUN;LEE, JUN-KUK;JUNG, HYUNG-JIN
分类号 H01L21/20;C23C14/02;C23C14/08;(IPC1-7):H01L21/20 主分类号 H01L21/20
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