| 摘要 |
PROBLEM TO BE SOLVED: To improve test coverage by supplying a plurality of instructions to a CPU while using an internal state value at part of a scan pass circuit as a burn-in test pattern by operating the scan pass circuit when a burn-in test mode signal is received. SOLUTION: In a burn-in test, an output 11 for the burn-in test composed of the scan pass circuit provided inside a peripheral circuit 4 is controlled by a control signal 8 generated by a burn-in test control part 3 and a shift clock signal 16 while using a reset signal 17 and a burn-in test mode signal 9. Then, the burn-in test pattern (instruction code) is supplied to a CPU 2. An internal data path 5 is driven by a tristate buffer 6 using an enable signal 10 from the burn-in test control part 3. Then, the output 11 for burn-in test inside the peripheral circuit 4 is generated so as to be initialized and then to be time sequentially switched by the shift clock signal 16. |
