| 摘要 |
PROBLEM TO BE SOLVED: To greatly save the time and trouble for test pattern generation. SOLUTION: A macro common test pattern is written to a storage part 21, a conversion library for a CPU series is previously stored in a storage part 22, and a parameter file for product is stored in a storage part 23. A test pattern converter 26 reads data for conversion out of the conversion library for CPU series according to a CPU series name inputted from an operation part 25 and reads data for conversion out of the parameter file for product according to a type number inputted from the operation part 25. Then the macro common test pattern is read out of the storage part 21 in sequence and converted with the above-mentioned data for conversion to generate a macro test pattern for product, which is written to a storage part 27. |
